Identification of Defects and Secondary Phases in Reactively Sputtered Cu2 ZnSnS4 Thin Films презентация

Outline Motivation Problems with characterization of thin films Experimental approach Results X-ray diffraction Raman Spectroscopy Transmission Electron Microscopy Scanning Auger Microscopy Summary & Acknowledgements

Слайд 1Identification of Defects and Secondary Phases in Reactively Sputtered Cu2ZnSnS4 Thin

Films

Vardaan Chawla, Stacey Bent, Bruce Clemens
April 7th, 2010

Center on Nanostructuring for Efficient Energy Conversion
Materials Science and Engineering
Stanford University



Слайд 2Outline





Motivation
Problems with characterization of thin films
Experimental approach
Results
X-ray diffraction
Raman Spectroscopy
Transmission Electron Microscopy
Scanning

Auger Microscopy
Summary & Acknowledgements

Слайд 3Motivation – Phase Equilibrium





CZTS is a line compound between Cu2SnS3 and

ZnS
Theoretically even a 2-3% compositional variation could lead to phase separation

Ternary Phase Diagram

Binary Phase Diagram

Olekseyuk, I.D. "Phase Equilibria in the Cu2S-ZnS-SnS2 System." Journal of Alloys and Compounds. 368. (2004): 135-143. Print.


CZTS


Слайд 4Motivation – Crystal Structure





Crystal structures of secondary phases similar to CZTS
All

primary peaks overlap and hard to separate
Low intensity peaks cannot be seen easily in thin films

Theoretical XRD Patterns of CZTS, Cu2SnS3, and ZnS


Слайд 5Experimental Approach








Substrate
Cu
Zn
Sn
Introduce H2S into chamber during sputter deposition
Sulfur is incorporated into

the film in one step (no anneal)
Expect to see higher densities and improved film quality

Reactive Sputtering


Слайд 6Characterization - XRD





Varying Zn/(Cu+Sn) Ratio
Zn/(Cu+Sn) ratio is varied while holding Cu/Sn

ratio constant
Impossible to determine difference between CZTS, CTS, and ZnS from XRD pattern

(101)

(200)

(220)

(312)

(112)

Olekseyuk, I.D. "Phase Equilibria in the Cu2S-ZnS-SnS2 System." Journal of Alloys and Compounds. 368. (2004): 135-143. Print.







Слайд 7Characterization - XRD





Varying Cu/(Zn+Sn) Ratio
Cu/(Zn+Sn) ratio is varied while holding Zn/Sn

ratio constant
Need to get very far off 2:1:1 stoichiometry before any CuxS phases can be seen
CuxS can be removed with KCN etch

(101)

(200)

(220)

(312)

(112)

Olekseyuk, I.D. "Phase Equilibria in the Cu2S-ZnS-SnS2 System." Journal of Alloys and Compounds. 368. (2004): 135-143. Print.






Слайд 8Characterization – Raman





Varying Zn/(Cu+Sn) Ratio
Raman spectra show only minor changes even

though composition is varied dramatically
No evidence of the CuxS phase shown by other groups at growth temperatures higher than 500C

Varying Cu/(Zn+Sn) Ratio


Слайд 9Device Fabrication





Glass Substrate
3000 µm
Molybdenum Layer
1 µm
1.75 µm
CdS (n-type)
55 nm
ZnO:Al (n-type)
340 nm
Aluminum

Grid

CZTS Absorber (p-type)

CZTS Device Stack

Zn-rich films incorporated into standard CIGS device stack for testing

ZnO

85 nm

ZnO

ZnO:Al

CdS

CZTS

Mo

SEM Image


Слайд 10Device Characterization





I-V Measurement
EQE Measurement
First CZTS devices grown by a reactive sputtering

process
Efficiency = 1.35%
Degraded EQE clearly points to undetected defects in the absorber

Слайд 11Characterization - TEM





500nm


Detrimental secondary phase interspersed in CZTS matrix

Stacking faults in

the secondary phase point to a transition between cubic and hexagonal crystal structures



Слайд 12Characterization - Auger





Raster beam over sputtered surface of sample and scan

for Cu, Zn, Sn
Overlay Cu, Zn, Sn signal
Composition variation points to CZTS / ZnS (Zn-rich)

2 um

Cu

Zn

Sn

CZTS

ZnS


Слайд 13Characterization - CdZnS





Cd penetration into ZnS lowers the cubic-hexagonal transition temperature
Stacking

faults in TEM images are created during CBD of CdS layer

CdS – ZnS Phase Diagram

(101)

H-ZnS

(220)

(312)

(112)


XRD before and after CBD

C

C + H

H

Chen et al.“Solid State Phase Equilibria in the ZnS-CdS System." Materials Research Bulletin. 23. (1988): 1667-1673. Print.


Слайд 14Characterization - Auger





Sn
Cd
Overlay Sn and Cd signal
Cd ion exchanges with Zn

during bath deposition and penetrates the ZnS phase

CZTS

CdZnS

2 um


Слайд 15Summary





CZTS thin films were grown using Reactive Sputtering
Films were characterized using

X-ray Diffraction and Raman Spectroscopy
Full devices have been grown and tested but are limited due to secondary phases in the films
Transmission Electron Microscopy and Scanning Auger Microscopy can be used to identify these secondary phases

Слайд 16Acknowledgements





US Department of Energy, Office of Basic Energy Sciences as part

of an Energy Frontier Research Center
http://www.er.doe.gov/bes/EFRC/index.html

Applied Quantum Technologies
Local thin film solar startup
http://www.aqtsolar.com

Слайд 17Questions





Questions?


Обратная связь

Если не удалось найти и скачать презентацию, Вы можете заказать его на нашем сайте. Мы постараемся найти нужный Вам материал и отправим по электронной почте. Не стесняйтесь обращаться к нам, если у вас возникли вопросы или пожелания:

Email: Нажмите что бы посмотреть 

Что такое ThePresentation.ru?

Это сайт презентаций, докладов, проектов, шаблонов в формате PowerPoint. Мы помогаем школьникам, студентам, учителям, преподавателям хранить и обмениваться учебными материалами с другими пользователями.


Для правообладателей

Яндекс.Метрика